Design, Analysis and Test of Logic Circuits Under Uncertainty
Smita Krishnaswamy, Igor L. Markov, John P. Hayes (auth.)
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Catégories:
Année:
2013
Edition:
1
Editeur::
Springer Netherlands
Langue:
english
Pages:
124
ISBN 10:
9048196442
ISBN 13:
9789048196449
Collection:
Lecture Notes in Electrical Engineering 115
Fichier:
PDF, 4.97 MB
IPFS:
,
english, 2013